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Bayesian multiparameter quantum metrology with limited data

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A longstanding problem in quantum metrology is how to extract as much information as possible in realistic scenarios with not only multiple unknown parameters, but also limited measurement data and… Click to show full abstract

A longstanding problem in quantum metrology is how to extract as much information as possible in realistic scenarios with not only multiple unknown parameters, but also limited measurement data and some degree of prior information. Here we present a practical solution to this: We derive a Bayesian multi-parameter quantum bound, construct the optimal measurement when our bound can be saturated for a single shot, and consider experiments involving a repeated sequence of these measurements. Our method properly accounts for the number of measurements and the degree of prior information, and we illustrate our ideas with a qubit sensing network and a model for phase imaging, clarifying the nonasymptotic role of local and global schemes. Crucially, our technique is a powerful way of implementing quantum protocols in a wide range of practical scenarios that tools such as the Helstrom and Holevo Cram\'er-Rao bounds cannot normally access.

Keywords: metrology limited; multiparameter quantum; quantum metrology; metrology; bayesian multiparameter; quantum

Journal Title: Physical Review A
Year Published: 2020

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