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Extreme expected values and their applications in quantum metrology

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Wangjun Lu, 2, ∗ Lei Shao, Xingyu Zhang, Zhucheng Zhang, Jie Chen, Hong Tao, and Xiaoguang Wang † Zhejiang Institute of Modern Physics, Department of Physics, Zhejiang University, Hangzhou 310027,… Click to show full abstract

Wangjun Lu, 2, ∗ Lei Shao, Xingyu Zhang, Zhucheng Zhang, Jie Chen, Hong Tao, and Xiaoguang Wang † Zhejiang Institute of Modern Physics, Department of Physics, Zhejiang University, Hangzhou 310027, China Department of Maths and Physics, Hunan Institute of Engineering, Xiangtan 411104, China MOE Key Laboratory of Fundamental Physical Quantities Measurement and Hubei Key Laboratory of Gravitation and Quantum Physics, PGMF and School of Physics, Huazhong University of Science and Technology, Wuhan 430074, China (Dated: November 2, 2021)

Keywords: expected values; physics; applications quantum; metrology; extreme expected; values applications

Journal Title: Physical Review A
Year Published: 2022

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