LAUSR.org creates dashboard-style pages of related content for over 1.5 million academic articles. Sign Up to like articles & get recommendations!

Silicon Nitride Metalenses for Close-to-One Numerical Aperture and Wide-Angle Visible Imaging

Photo from academic.microsoft.com

SiN is an emerging semiconductor for integrated optoelectronics, due to its ultralow loss in the visible region. Developing a high-performance SiN metamaterial lens (metalens) is attractive for on-chip optical devices,… Click to show full abstract

SiN is an emerging semiconductor for integrated optoelectronics, due to its ultralow loss in the visible region. Developing a high-performance SiN metamaterial lens (metalens) is attractive for on-chip optical devices, but is held back by technical challenges in nanofabrication. The authors report the experimental realization of a SiN metalens that is 1 cm across and 695 nm thick, by means of CMOS-compatible fabrication. With high-quality, wide-angle visible imaging, these results point to the miniaturization of lenses for optical fibers, microendoscopes, and smart phones, as well as applications in all-sky telescopes, large-angle beam shaping, and near-eye imaging.

Keywords: silicon nitride; angle visible; wide angle; visible imaging; nitride metalenses

Journal Title: Physical review applied
Year Published: 2018

Link to full text (if available)


Share on Social Media:                               Sign Up to like & get
recommendations!

Related content

More Information              News              Social Media              Video              Recommended



                Click one of the above tabs to view related content.