An in-depth structural study of a 23-nm-thick ${\mathrm{BiFeO}}_{3}$ film grown on orthorhombic ${\mathrm{NdScO}}_{3}\phantom{\rule{4pt}{0ex}}{\left(110\right)}_{O}$ substrates demonstrates the presence of a mixed phases. Atomic resolution scanning transmission electron microscopy measurements reveal an… Click to show full abstract
An in-depth structural study of a 23-nm-thick ${\mathrm{BiFeO}}_{3}$ film grown on orthorhombic ${\mathrm{NdScO}}_{3}\phantom{\rule{4pt}{0ex}}{\left(110\right)}_{O}$ substrates demonstrates the presence of a mixed phases. Atomic resolution scanning transmission electron microscopy measurements reveal an out-of-plane stripe domain structure typical of rhombohedral ${\mathrm{BiFeO}}_{3}$ films but with a polarization component along pseudocubic ${\ensuremath{\langle}100\ensuremath{\rangle}}_{PC}$ or canted from the ${\ensuremath{\langle}111\ensuremath{\rangle}}_{PC}$ towards the in-plane direction. Photovoltaic measurements display an anomalous modulation of the open circuit voltage as temperature is decreased that is attributed to a structural change associated with a transition to a single structural phase.
               
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