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Detailed characterization of supported eutectic droplets using photoemission electron microscopy

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Pt-Ge eutectic alloy droplets are scrutinized by microscopic analysis of electrons excited by 4.9-eV photons. Using only the work function and contact angle as fitting parameters, we determine the exact… Click to show full abstract

Pt-Ge eutectic alloy droplets are scrutinized by microscopic analysis of electrons excited by 4.9-eV photons. Using only the work function and contact angle as fitting parameters, we determine the exact droplet shape that reproduces the experimental electron emission profile. The local inclination of the droplets' surface plays a decisive role in the generated emission profile. Intensity variations at the illuminated side of the eutectic droplets are a consequence of standing waves in the electromagnetic field responsible for excitation. Intensity variations at the nonilluminated side are ascribed to a diffraction pattern of the photons after their interaction with the droplet.

Keywords: supported eutectic; characterization supported; microscopy; detailed characterization; electron; eutectic droplets

Journal Title: Physical Review Materials
Year Published: 2021

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