Random quantum circuits have played a central role in establishing the computational advantages of near-term quantum computers over their conventional counterparts. Here, we use ensembles of low-depth random circuits with… Click to show full abstract
Random quantum circuits have played a central role in establishing the computational advantages of near-term quantum computers over their conventional counterparts. Here, we use ensembles of low-depth random circuits with local connectivity in $D\ge 1$ spatial dimensions to generate quantum error-correcting codes. For random stabilizer codes and the erasure channel, we find strong evidence that a depth $O(\log N)$ random circuit is necessary and sufficient to converge (with high probability) to zero failure probability for any finite amount below the channel capacity for any $D$. Previous results on random circuits have only shown that $O(N^{1/D})$ depth suffices or that $O(\log^3 N)$ depth suffices for all-to-all connectivity ($D \to \infty$). We then study the critical behavior of the erasure threshold in the so-called moderate deviation limit, where both the failure probability and the distance to the channel capacity converge to zero with $N$. We find that the requisite depth scales like $O(\log N)$ only for dimensions $D \ge 2$, and that random circuits require $O(\sqrt{N})$ depth for $D=1$. Finally, we introduce an "expurgation" algorithm that uses quantum measurements to remove logical operators that cause the code to fail by turning them into either additional stabilizers or into gauge operators in a subsystem code. With such targeted measurements, we can achieve sub-logarithmic depth in $D\ge 2$ spatial dimensions below capacity without increasing the maximum weight of the check operators. We find that for any rate beneath the capacity, high-performing codes with thousands of logical qubits are achievable with depth 4-8 expurgated random circuits in $D=2$ dimensions. These results indicate that finite-rate quantum codes are practically relevant for near-term devices and may significantly reduce the resource requirements to achieve fault tolerance for near-term applications.
               
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