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A method to distinguish between two symmetrically equivalent opposite ð1120Þ and ð1120Þ faces of an a-plane sapphire wafer is described. It is shown that use of conventional X-ray diffraction analysis… Click to show full abstract
A method to distinguish between two symmetrically equivalent opposite ð1120Þ and ð1120Þ faces of an a-plane sapphire wafer is described. It is shown that use of conventional X-ray diffraction analysis makes it possible to determine the ‘sign’ of the sapphire a face in contrast to the ‘sign’ of the c, m or r faces. Correct determination of the a-plane wafer orientation is important for further growth and processing of heteroepitaxial structures.
Keywords:
distinguish opposite;
sapphire;
sapphire wafer;
faces plane;
plane sapphire;
plane
Journal Title: Journal of Applied Crystallography
Year Published: 2018
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Journal Title: Journal of Applied Crystallography
Year Published: 2018
Link to full text (if available)
Share on Social Media: Sign Up to like & get
recommendations!