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Quantitative microstructural characterization of nanocrystalline materials based on Rietveld refinement of electron diffraction patterns has been used to explore sample characteristics. The electron microscope instrumental effects have been considered. Click to show full abstract
Quantitative microstructural characterization of nanocrystalline materials based on Rietveld refinement of electron diffraction patterns has been used to explore sample characteristics. The electron microscope instrumental effects have been considered.
Keywords:
electron diffraction;
nanocrystalline materials;
characterization nanocrystalline;
methodology
Journal Title: Journal of Applied Crystallography
Year Published: 2022
Link to full text (if available)
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Journal Title: Journal of Applied Crystallography
Year Published: 2022
Link to full text (if available)
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recommendations!