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Theoretical consideration and experimental demonstration reveal that the contrast variation in a birefringence image of an off-axis SiC wafer corresponds to the in-plane shear stress field. Click to show full abstract
Theoretical consideration and experimental demonstration reveal that the contrast variation in a birefringence image of an off-axis SiC wafer corresponds to the in-plane shear stress field.
Keywords:
plane shear;
observation plane;
axis sic;
birefringence;
shear stress
Journal Title: Journal of Applied Crystallography
Year Published: 2022
Link to full text (if available)
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Journal Title: Journal of Applied Crystallography
Year Published: 2022
Link to full text (if available)
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recommendations!