Small-angle neutron scattering and small-angle X-ray scattering are important experimental techniques for studying the behaviour and properties of materials on the nanoscale. This article describes a numerical algorithm that uses… Click to show full abstract
Small-angle neutron scattering and small-angle X-ray scattering are important experimental techniques for studying the behaviour and properties of materials on the nanoscale. This article describes a numerical algorithm that uses reverse Monte Carlo simulations to model scattering intensities observed on a two-dimensional small-angle scattering detector.
               
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