An inclined geometry is investigated for X-ray total scattering measurements using a digital flat-panel area detector. The inclined geometry enables acquisition of higher quality data for simultaneous Rietveld refinement and… Click to show full abstract
An inclined geometry is investigated for X-ray total scattering measurements using a digital flat-panel area detector. The inclined geometry enables acquisition of higher quality data for simultaneous Rietveld refinement and total scattering studies, yielding structural information on the short-, medium- and long-range orders from one single measurement.
               
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