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An inclined geometry is investigated for X-ray total scattering measurements using a digital flat-panel area detector. The inclined geometry enables acquisition of higher quality data for simultaneous Rietveld refinement and… Click to show full abstract
An inclined geometry is investigated for X-ray total scattering measurements using a digital flat-panel area detector. The inclined geometry enables acquisition of higher quality data for simultaneous Rietveld refinement and total scattering studies, yielding structural information on the short-, medium- and long-range orders from one single measurement.
Keywords:
total scattering;
scattering measurements;
ray total;
geometry;
detector
Journal Title: Journal of Applied Crystallography
Year Published: 2023
Link to full text (if available)
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Journal Title: Journal of Applied Crystallography
Year Published: 2023
Link to full text (if available)
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recommendations!