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A single-shot spectrometer for the tender X-ray range is presented, based on the von Hamos geometry and using elastic scattering as a fingerprint of the XFEL-produced spectrum. Click to show full abstract
A single-shot spectrometer for the tender X-ray range is presented, based on the von Hamos geometry and using elastic scattering as a fingerprint of the XFEL-produced spectrum.
Keywords:
single shot;
shot spectrometer;
tender ray
Journal Title: Journal of Synchrotron Radiation
Year Published: 2018
Link to full text (if available)
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Journal Title: Journal of Synchrotron Radiation
Year Published: 2018
Link to full text (if available)
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recommendations!