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Effect of reflection and refraction on NEXAFS spectra measured in TEY mode

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A study of the effect of reflection and refraction processes on the evolution of the total-electron-yield spectrum over a wide range of incidence angles including grazing angles is reported. Click to show full abstract

A study of the effect of reflection and refraction processes on the evolution of the total-electron-yield spectrum over a wide range of incidence angles including grazing angles is reported.

Keywords: effect reflection; refraction nexafs; reflection refraction

Journal Title: Journal of Synchrotron Radiation
Year Published: 2018

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