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Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers

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A fluorescence intensity monitor has been developed for the non-invasive, pulse-by-pulse normalization of LCLS-II experiments. The linearity, noise and position sensitivity of the detectors have been characterized. Click to show full abstract

A fluorescence intensity monitor has been developed for the non-invasive, pulse-by-pulse normalization of LCLS-II experiments. The linearity, noise and position sensitivity of the detectors have been characterized.

Keywords: intensity monitors; intensity; intensity beam; position; monitors intensity; fluorescence intensity

Journal Title: Journal of Synchrotron Radiation
Year Published: 2019

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