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Using diffraction losses of X-rays in a single crystal for determination of its lattice parameters as well as for monochromator calibration

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Diffraction losses (glitches) at certain energies of the X-ray beam, transmitted through a single crystal, can be used for lattice parameters determination as well as for calibrating the monochromator (absolute… Click to show full abstract

Diffraction losses (glitches) at certain energies of the X-ray beam, transmitted through a single crystal, can be used for lattice parameters determination as well as for calibrating the monochromator (absolute pitch angle and the unit-cell parameter).

Keywords: using diffraction; single crystal; diffraction losses; lattice parameters

Journal Title: Journal of Synchrotron Radiation
Year Published: 2022

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