Diffraction losses (glitches) at certain energies of the X-ray beam, transmitted through a single crystal, can be used for lattice parameters determination as well as for calibrating the monochromator (absolute… Click to show full abstract
Diffraction losses (glitches) at certain energies of the X-ray beam, transmitted through a single crystal, can be used for lattice parameters determination as well as for calibrating the monochromator (absolute pitch angle and the unit-cell parameter).
               
Click one of the above tabs to view related content.