This work presents the implementation of combined high-resolution X-ray in-line holography and X-ray fluorescence microscopy within the same experimental setup at a hard X-ray nanofocusing beamline. In-line holography provides morphological… Click to show full abstract
This work presents the implementation of combined high-resolution X-ray in-line holography and X-ray fluorescence microscopy within the same experimental setup at a hard X-ray nanofocusing beamline. In-line holography provides morphological information by recovering electron density maps, even on weakly scattering or low-contrast samples; X-ray fluorescence provides complementary chemical information by producing element-specific mass density maps.
               
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