LAUSR

A new fabrication technique for spherical crystal analyzers using a microporous aluminium base is introduced. It eliminates the need for permanent bonding of the crystal to the substrate, avoiding long-term degradation of the permanent bond and making the base and crystal reusable. Using this fabrication method, diced Si(844) and Ge(337) analyzers have been characterized with high-resolution resonant inelastic X-ray scattering, a technique which is particularly sensitive to analyzer imperfections.