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Sub-micrometer focusing setup for high-pressure crystallography at the Extreme Conditions beamline at PETRA III

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Facing the challenges of X-ray diffraction from tiny samples subjected to multimegabar pressures, instrumentation developments are presented that enable, among other studies, single-crystal data collection from micrometer- to sub-micrometer-sized grains.… Click to show full abstract

Facing the challenges of X-ray diffraction from tiny samples subjected to multimegabar pressures, instrumentation developments are presented that enable, among other studies, single-crystal data collection from micrometer- to sub-micrometer-sized grains. The developments are based on a sub-micrometer beam capability employing compound refractive lenses operating with a phase correcting plate and a precise motorization solution.

Keywords: micrometer; micrometer focusing; setup high; sub micrometer; focusing setup

Journal Title: Journal of Synchrotron Radiation
Year Published: 2022

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