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Quantifying sources of error in X-ray transmission measurements provides objective guidance for questions of optimum sample thickness and beamline configuration for higher-order suppression. Click to show full abstract
Quantifying sources of error in X-ray transmission measurements provides objective guidance for questions of optimum sample thickness and beamline configuration for higher-order suppression.
Keywords:
quantifying signal;
signal quality;
scanning transmission;
microscopy;
transmission;
quality scanning
Journal Title: Journal of Synchrotron Radiation
Year Published: 2022
Link to full text (if available)
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Journal Title: Journal of Synchrotron Radiation
Year Published: 2022
Link to full text (if available)
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recommendations!