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A new spot characterization method is proposed, based on coherent diffraction imaging that can accurately determine the focal spot size of a single X-ray free-electron laser pulse. This method was… Click to show full abstract
A new spot characterization method is proposed, based on coherent diffraction imaging that can accurately determine the focal spot size of a single X-ray free-electron laser pulse. This method was successfully applied to characterize the focal spot size at the Coherent Scattering and Imaging endstation of the Shanghai Soft X-ray Free Electron Laser Facility.
Keywords:
spot;
free electron;
spot size;
focal spot;
ray free
Journal Title: Journal of Synchrotron Radiation
Year Published: 2023
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Journal Title: Journal of Synchrotron Radiation
Year Published: 2023
Link to full text (if available)
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recommendations!