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Rayleigh-scattering microscopy for tracking and sizing nanoparticles in focused aerosol beams

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Rayleigh-scattering microscopy permits tracking and sizing of aerosolized particles down to 40 nm in diameter. It lays the foundation for lab-based injector development and online injection diagnostics for X-ray free-electron laser… Click to show full abstract

Rayleigh-scattering microscopy permits tracking and sizing of aerosolized particles down to 40 nm in diameter. It lays the foundation for lab-based injector development and online injection diagnostics for X-ray free-electron laser (XFEL) research.

Keywords: microscopy; sizing nanoparticles; rayleigh scattering; tracking sizing; scattering microscopy; microscopy tracking

Journal Title: IUCrJ
Year Published: 2018

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