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DeepRes: a new deep-learning- and aspect-based local resolution method for electron-microscopy maps

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A method (DeepRes) is presented to estimate a new local quality measure for 3D cryoEM maps that adopts the form of a ‘local resolution’ type of information. DeepRes is fully… Click to show full abstract

A method (DeepRes) is presented to estimate a new local quality measure for 3D cryoEM maps that adopts the form of a ‘local resolution’ type of information. DeepRes is fully automatic and parameter-free and avoids the issues of most current methods, such as their insensitivity to enhancements owing to B-factor sharpening, among others.

Keywords: microscopy; new deep; method; local resolution; deepres new

Journal Title: IUCrJ
Year Published: 2019

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