Model transformations and model-driven engineering (MDE) have been applied widely in service-oriented architecture based information systems. To support the development of such a service-oriented information system, it is necessary to… Click to show full abstract
Model transformations and model-driven engineering (MDE) have been applied widely in service-oriented architecture based information systems. To support the development of such a service-oriented information system, it is necessary to guarantee the quality of model transformations. With the increasing complexity and scale of model transformations, debugging of model transformations becomes more and more time-consuming and difficult, there is an increasing need to rely on efficient and accurate fault localization approaches to help with debugging. Among the existing fault localization approaches, the spectrum-based fault localization (SBFL), as a dynamic analysis method, mainly used the coverage information and execution results of the rules of model transformation to estimate the probability of each rule may be faulty. However, there are many false-positive and false-negative results in the rule coverage information, the accuracy of the SBFL is not ideal, so we consider mining the impact of covered range in different test models to further improve the effectiveness of fault localization. In this paper, we propose an optimized strategy of fault localization based on the impact of the test model, according to the covered range of test models, weight values are assigned to different test models, and the statistical coverage information of rules are weighted and adjusted accordingly. We compare the proposed approach with the SBFL, the experimental results show that under the same techniques for computing the suspiciousness, our approach can help locate around 26% more faulty rules in the ranking Top-1 of the suspicious list than the SBFL, the effectiveness of fault localization techniques can be improved by 50.42% in the best case and 8.9% in the average case.
               
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