An efficient degraded deductive simulator for small delay defects is proposed. The proposed method takes into account the conditions of re-convergence sensitization and hazard-based detection, providing fast and accurate simulation… Click to show full abstract
An efficient degraded deductive simulator for small delay defects is proposed. The proposed method takes into account the conditions of re-convergence sensitization and hazard-based detection, providing fast and accurate simulation results for small delay defects. Separate simulation strategies for faults with different fault effects are proposed. For faults on fault effects re-convergent fan-out stems, the serial simulation technique is applied. For other faults, a deductive simulation technique is proposed to accelerate the simulation. Different from previous works, serial simulations are carried out no longer for all faults on fan-out re-convergent stems, but only for fault effects re-convergences, and the other faults are parallel simulated with the degraded deductive technique, which eliminates “AND” operation and the propagation of fault-list is simpler than conventional deductive ones. Experimental results demonstrate that the proposed simulator that can further accelerate the fault simulation in efficiency. It achieves a 28.3X speedup on average compared with the serial simulation method, and a 3.92X speedup on average compared with the critical path tracing based method.
               
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