A DC instrument transformer test set (ITTS), as an error measurement device for DC instrument transformers, needs to be calibrated regularly to ensure its accuracy. Existing calibration technology can only… Click to show full abstract
A DC instrument transformer test set (ITTS), as an error measurement device for DC instrument transformers, needs to be calibrated regularly to ensure its accuracy. Existing calibration technology can only achieve DC ITTS error calibrations within a zero analog standard error. This paper proposes a wide-range digital-analog mixed calibration scheme for a DC ITTS based on multistage serial proportional micro-difference technology and high-speed high-precision sampling and coding technology, achieving a digital-analog standard error of ±1% that can be fine-tuned in 0.001% steps. A prototype is developed, and the prototype test results show that the expanded uncertainty of the prototype does not exceed
               
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