LAUSR

In high-frequency electronic equipment and power electronic devices, the dynamic performance of switching devices is one of the important indicators, and a double-pulse test circuit is usually used to test the dynamic performance of switching devices. In order to reduce the stray inductance existing in the test circuit, a double-pulse test circuit structure based on PCB is firstly proposed, and then the basic principle of using the integral calculation method to extract the PCB stray inductance is analyzed. Then the 3D model of the PCB is established, and the PCB stray inductance extraction based on 3D simulation is completed. Finally, a 1200V/100A double-pulse test experimental platform is built. By comparing the three-dimensional simulation results with the numerical calculation results using the integral method under the double-pulse test experiment, the accuracy and effectiveness of the three-dimensional simulation method proposed in this paper are verified.