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Origins and Mechanisms of Bias Instability Noise in a Three-Axis Mode-Matched MEMS Gyroscope

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In this paper, we examine the origins of bias instability in three-axis, mode-matched MEMS gyroscopes. Reducing this drift phenomenon is crucial for highly accurate navigation in applications, such as automated… Click to show full abstract

In this paper, we examine the origins of bias instability in three-axis, mode-matched MEMS gyroscopes. Reducing this drift phenomenon is crucial for highly accurate navigation in applications, such as automated driving or indoor localization. We show that for a typical MEMS gyroscope, bias instability noise becomes the dominant orientation error component after less than 10 s of integration time. A model-based approach summarizing the most common sources of zero-rate offset is combined with a detailed experimental analysis. We find naturally occurring flicker noise acting on the frequency tuning electrodes to be the dominant source of bias instability for the in-plane axis. By controlling the frequency tuning state, we establish an unprecedented value for bias instability of an automotive-type MEMS gyroscope of lower than 0.1 dph—more than a factor 10 improvement from its performance in ordinary operation. Furthermore, we analyze the so far sparsely studied effect of scale-factor instability, which is an increase of drift that scales with applied angular rate. This phenomenon is particularly important for applications, where high angular rates are common, such as dead-reckoning with smart-phones. As out-of-plane MEMS gyroscopes are significantly more challenging to manufacture, their performance has been studied much less. The out-of-plane axes in this paper are shown to exhibit a complex composition of bias instability sources with a total level as low as 0.7 dph. The presented gyroscopes were furthermore designed for ultra-low white noise. The angle random walk (ARW) is lower than 2.5 md/s/rtHz in all three axes. [2018-0165]

Keywords: instability; bias instability; mems gyroscope; three axis; noise

Journal Title: Journal of Microelectromechanical Systems
Year Published: 2019

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