We propose a pressure sensor composed of single-gate and dual-gate amorphous-indium–gallium–zinc–oxide thin-film transistors (TFTs) that are integrated with a P(VDF-TrFE)/PZT composite piezo-capacitor. The TFTs are connected in an inverter configuration,… Click to show full abstract
We propose a pressure sensor composed of single-gate and dual-gate amorphous-indium–gallium–zinc–oxide thin-film transistors (TFTs) that are integrated with a P(VDF-TrFE)/PZT composite piezo-capacitor. The TFTs are connected in an inverter configuration, where the piezo-capacitor is connected to the floating top-gate of the dual-gate TFT (driving TFT). When the pressure is applied by finger pressing, the potential of the top-gate changes, and thus, the threshold voltage of the driving TFT shifts, leading to the generation of an output signal that is typically in the range of 200–300 mV.
               
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