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Sub-λ/2 Displacement Sensor With Nanometric Precision Based on Optical Feedback Interferometry Used as a Non-Uniform Event-Based Sampling System

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In this paper, a method based on the inherent event-based sampling capability of the laser optical feedback interferometry (OFI) is proposed to recover sub- $\lambda $ /2 displacement with a… Click to show full abstract

In this paper, a method based on the inherent event-based sampling capability of the laser optical feedback interferometry (OFI) is proposed to recover sub- $\lambda $ /2 displacement with a nanometric precision. The proposed method operates in open-loop configuration and relies on OFI’s fringe detection, thereby improving its robustness and ease of use. The measured white noise power spectral density is less than 100pm/ $\sqrt {\text {Hz}}$ with a corner noise frequency of approximately 80Hz for a laser diode emitting wavelength $\lambda _{{0}}$ of 785nm placed at 30cm of the target.

Keywords: tex math; inline formula; based sampling; event based

Journal Title: IEEE Sensors Journal
Year Published: 2020

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