In this letter, a nondestructive local characterization of graphene fabricated by the reduction method on graphene oxide aqueous was demonstrated by using a near-field scanning microwave microscopy (NSMM). The dielectric… Click to show full abstract
In this letter, a nondestructive local characterization of graphene fabricated by the reduction method on graphene oxide aqueous was demonstrated by using a near-field scanning microwave microscopy (NSMM). The dielectric properties of graphene films have been extracted to analyze the quality of graphene. Clear images of defects on graphene film were obtained by mapping the resonant frequency,
               
Click one of the above tabs to view related content.