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A multiple scattering method is proposed for the analysis of substrate-integrated waveguide (SIW) structures in this letter. SIW structures are considered to be parallel plates embedded by the fence of… Click to show full abstract
A multiple scattering method is proposed for the analysis of substrate-integrated waveguide (SIW) structures in this letter. SIW structures are considered to be parallel plates embedded by the fence of metallic vias (labeled as SIW vias). The addition theorem of cylindrical waves is applied to the calculation of the multiple scattering among SIW vias and coaxial ports. The reflection matrix of SIW vias, which is derived by boundary conditions, can be connected to the radial scattering matrix obtained by the multiple scattering method. This leads to the network parameters in terms of coaxial ports of SIW structures on a plate pair. The accuracy and efficiency of the multiple scattering method are verified by numerical simulations in commercial full-wave solvers.
Journal Title: IEEE Microwave and Wireless Components Letters
Year Published: 2020
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