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Uniaxial Strain Induced Critical Current Degradation of Ag-Sheathed Bi-2212 Round Wire

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The critical current degradation of Bi-2212 Ag-sheathed round wire subjected to uniaxial strain was studied at 4.2 K in 14 T background field. The strains applied on the sample are both tension… Click to show full abstract

The critical current degradation of Bi-2212 Ag-sheathed round wire subjected to uniaxial strain was studied at 4.2 K in 14 T background field. The strains applied on the sample are both tension and compression. The additional tensile strain caused by the difference in thermal expansion between the Bi-2212 round wire and Ti–6Al–4V alloy spring was calculated. The results showed that a drastic degradation of the critical current occurred when the intrinsic strain exceeded around 0.5% in tensile direction. For the compressive strain, the degradation of critical current was almost linear but more gradual than tensile strain. The intention is to use these results as a basis for Bi-2212 conductor and superconducting coil design.

Keywords: strain; critical current; current degradation; round wire

Journal Title: IEEE Transactions on Applied Superconductivity
Year Published: 2018

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