LAUSR.org creates dashboard-style pages of related content for over 1.5 million academic articles. Sign Up to like articles & get recommendations!

Reliability Analysis of Multiple-Outputs Logic Circuits Based on Structure Function Approach

Photo by dawson2406 from unsplash

Reliability is one of the principal characteristics in the design of many systems. Logic circuits are one of them. These systems are very interesting objects from the reliability point of… Click to show full abstract

Reliability is one of the principal characteristics in the design of many systems. Logic circuits are one of them. These systems are very interesting objects from the reliability point of view, because they have some characteristics that are not very common in classical approaches used in reliability engineering. First, their activity depends not only on the operability of its components (logic gates), but also on other influences, which are represented by values of the circuit input signals. Second, logic circuits are typical instances of noncoherent systems. We propose a new method of computing circuit availability (unavailability) and several measures for investigation of topological properties of a logic circuit. These measures allow us to detect components (logic gates) with the greatest influence on the circuit operability. The method is based on using the methodology of Boolean differential calculus. All the approaches presented in this paper are illustrated using the example of reliability analysis of a one-bit full adder.

Keywords: analysis multiple; reliability analysis; circuit; reliability; logic circuits

Journal Title: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Year Published: 2017

Link to full text (if available)


Share on Social Media:                               Sign Up to like & get
recommendations!

Related content

More Information              News              Social Media              Video              Recommended



                Click one of the above tabs to view related content.