Functionally possible scan-based tests create functional operation conditions during their functional capture cycles. This is important for avoiding failures that are caused by nonfunctional operation conditions rather than faults. However,… Click to show full abstract
Functionally possible scan-based tests create functional operation conditions during their functional capture cycles. This is important for avoiding failures that are caused by nonfunctional operation conditions rather than faults. However, the fault coverage achievable by functionally possible scan-based tests is lower than that achieved by unconstrained scan-based tests. In addition, the tests are fully specified, limiting the applicability of both test compaction and test data compression. This article introduces an approach, where a multicycle functionally possible scan-based test set is obtained from a compressed test set
               
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