LAUSR

Nowadays, field programmable gate arrays (FPGAs) have been widely adopted to serve as accelerators in artificial intelligence and big data related applications. Since the static random access memory (SRAM)-based FPGA is suffering from limited density and high leakage power, nonvolatile FPGAs have been proposed, where SRAM is replaced with emerging nonvolatile memories (NVMs). Multilevel cell (MLC), which can store multiple bits within one memory cell, further improves the density of nonvolatile FPGAs and shows great potential to enable large on-chip memory. However, it suffers from limited lifetime. In this article, we propose a wear leveling scheme to improve lifetime of MLC-based nonvolatile FPGAs. Instead of generating a series of configuration files for runtime reconfiguration, we propose to identify write-heavy MLC regions and dynamically transform them to durable single-level cell (SLC) mode. Specifically, we propose three modules: 1) pertaining to write behavior monitor; 2) approximate cost calculator; and 3) mode transformation manager to achieve adaptive mode transformations. We consider FPGA features to design these modules, which is different from implementations for MLC-SLC transformation in CPU architecture. Evaluation shows that the proposed scheme can improve lifetime for MLC nonvolatile FPGAs by $6.03\times $ , at cost of 12.5% storage overhead.