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Blind Quality Evaluator of Tone-Mapped HDR and Multi-Exposure Fused Images for Electronic Display

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The problem of reproducing high dynamic range (HDR) images on electronic display and photography with restricted dynamic range has gained a lot of interest in the consumer electronics community. There… Click to show full abstract

The problem of reproducing high dynamic range (HDR) images on electronic display and photography with restricted dynamic range has gained a lot of interest in the consumer electronics community. There exist various approaches to this issue, e.g., tone mapping operators (TMOs) and multi-exposure fusion algorithms (MEFs). Many existing image quality assessment (IQA) methods have been proposed to compare images of quality degradation generated by TMOs/MEFs. Although promising performances have been achieved, they seldom consider local specific artifacts difference (i.e., abnormal exposure and color cast) related with the TMOs/MEFs. To address this limitation, this paper proposes a Blind Quality Evaluator of Tone-Mapped HDR and Multi-Exposure Fused Images (BQE-TM/MEFI). First, two purpose-designed segment models are utilized to distinguish well-exposedness dense patches (WEDPes) and non-WEDPes, color cast patches (CCPes) and non-CCPes respectively. Second, multiple quality-perception features are extracted to measure local artifacts: 1) structure and sharpness features from WEDPes, 2) saturation features from non-CCPes, and 3) edge structure features. Then, three new low-complexity regional features (over-exposure ratio, entropy and color confidence index) are calculated based on over-exposure segmentation model. Finally, all extracted features are aggregated into a machine-learning regression model to pool a quality score. The simplicity and good performance of the proposed method makes it suitable for electronic displays and other consumer electronics.

Keywords: multi exposure; exposure; electronic display; images electronic; quality; blind quality

Journal Title: IEEE Transactions on Consumer Electronics
Year Published: 2021

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