LAUSR.org creates dashboard-style pages of related content for over 1.5 million academic articles. Sign Up to like articles & get recommendations!

Characterizing Approximate Adders and Multipliers for Mitigating Aging and Temperature Degradations

Photo from wikipedia

The performance of nanoscale semiconductor technologies has become susceptible to high temperatures and aging phenomena. While guard-bands have conventionally been used to combat degradation-induced timing violations, approximations have recently been… Click to show full abstract

The performance of nanoscale semiconductor technologies has become susceptible to high temperatures and aging phenomena. While guard-bands have conventionally been used to combat degradation-induced timing violations, approximations have recently been leveraged to compensate for degradations in lieu of adding timing guard-bands, without a loss in performance. However, only simple approximation techniques such as truncation have been considered in prior work. In this paper, a wide range of approximate arithmetic circuits including adders and multipliers using various sophisticated approximation techniques are investigated to cope with aging- and temperature-induced degradations. To this end, approximate circuits are first characterized for their delay increase under degradations. With this, we then determine the approximation level required to compensate for guard-bands under different degradations. Degradation-aware logic synthesis results show that the simple use of truncated arithmetic circuits leads to a higher quality loss compared to using other approximate circuits. However, a truncated multiplier has the lowest error distance towards a reliable operation in 10 years. The approximate multipliers with configurable error recovery are most suitable when the level of degradation is higher, e.g., at a temperature of 70 °C. The characterization of degradation at the circuit level is then used for design exploration at the architecture level without the need for further gate-level simulations. For three different image processing applications, experimental results show that guard-bands can be mitigated while maintaining an output result with a high visual quality.

Keywords: aging temperature; guard bands; level; temperature; adders multipliers; degradation

Journal Title: IEEE Transactions on Circuits and Systems I: Regular Papers
Year Published: 2022

Link to full text (if available)


Share on Social Media:                               Sign Up to like & get
recommendations!

Related content

More Information              News              Social Media              Video              Recommended



                Click one of the above tabs to view related content.