LAUSR

A new unipolar differential logic (UDL) for the large-scale integration of amorphous In-Ga-Zn-O (aIGZO) digital circuits is proposed. Only single-threshold single-gate and aIGZO thin-film transistors are required. The proposed UDL logic gates are very insensitive to transistor parameter variations (i.e., threshold voltage, mobility, off-current, and subthreshold slope), which are inherently due to large-area low-temperature fabrication processes and operating conditions. To assess the UDL effectiveness, a wide range of parameter variations is considered: and, owing to the proposed architecture up to 1.5 $\times$ 10⁷ UDL gates that can be integrated with a yield that is greater than 90%.