This paper investigates the impacts of typical semiconductor material properties—electron affinity, bandgap, and dielectric constant, on the electrical performance of a p-type core–shell heterojunction nanowire FET by numerical simulations. At… Click to show full abstract
This paper investigates the impacts of typical semiconductor material properties—electron affinity, bandgap, and dielectric constant, on the electrical performance of a p-type core–shell heterojunction nanowire FET by numerical simulations. At the heterojunction, a valence band offset of 200 meV forms a sufficient energy barrier confining the holes in the quantum well, resulting in the optimal OFF-state current. A higher dielectric constant of the shell region is found to be able to decrease the leakage current of the device. The optimum conditions from the parameter analysis are demonstrated by a realistic and achievable material combination of Si/SiGe for the core–shell configuration. This paper provides physical insights into the materialwise impacts for designing the proposed transistor showing the reduced OFF-current and a better subthreshold swing for low-power applications.
               
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