Due to the Boltzmann distribution of carriers, the subthreshold swing (SS) of traditional metal–oxide–semiconductor field-effect transistors (MOSFETs) is above 60 mV/dec at room temperature. In this article, GaN-based negative capacitance… Click to show full abstract
Due to the Boltzmann distribution of carriers, the subthreshold swing (SS) of traditional metal–oxide–semiconductor field-effect transistors (MOSFETs) is above 60 mV/dec at room temperature. In this article, GaN-based negative capacitance field-effect transistors (NCFETs) were fabricated by introducing HfO2 /P(VDF-TrFE) stack as the gate dielectric layer. With the voltage amplification effect of the ferroelectric, the GaN NCFETs demonstrate the ultralow SS value of 36.3 mV/dec at room temperature, which also advances the MOSFETs in terms of saturation current (
               
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