LAUSR

This paper provides a generalized technique for predicting bulk current injection (BCI) test results. The injected RF disturbance that reaches an integrated circuit (IC) is calculated using electromagnetic (EM) analysis. A three-dimensional (3-D) model of the equipment under test (EUT) can provide the terminal voltages of an IC whose references are the ground terminal of the IC, not the BCI test setup reference ground plane. Auxiliary equipment (AE) comprising an electric load and artificial networks are also modeled in 3-D, making it possible to take into account the mode conversion from common mode (CM) to differential mode. The most important technique for the modeling is the interfaces between each 3-D model. Quasi-transverse-EM port calculated by 2-D EM analysis at the cross section of the wires is adopted as the interface. In defining the failure threshold, we adopted the IC immunity macromodel for conducted immunity, which is based on the measurement of the direct RF power injection method. The proposed method was applied to several BCI tests with AEs that have different mode conversion characteristics and EUTs that have different CM impedances. The simulated results showed good correlation with the experimental results.