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SCAN: Scattering Characteristics Analysis Network for Few-Shot Aircraft Classification in High-Resolution SAR Images

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Recently, deep learning in synthetic aperture radar (SAR) automatic target recognition (ATR) has made significant progress, but the sample limitation problem in the SAR field is still obvious. Compared with… Click to show full abstract

Recently, deep learning in synthetic aperture radar (SAR) automatic target recognition (ATR) has made significant progress, but the sample limitation problem in the SAR field is still obvious. Compared with the optical remote sensing images, the SAR images are insufficient, especially those containing the geospatial targets with certain target attitude angles (TAAs). To solve these problems, a novel few-shot learning framework named scattering characteristics analysis network (SCAN) is proposed in this article. First, a scattering extraction module (SEM) is designed to combine the target imaging mechanism with the network, which learns the number and distribution of the scattering points for each target type via explicit supervision. Besides, considering the imaging variability of SAR targets, a TAA-guided metalearning network consisting of an angle self-adaption classifier (ASC) and a frequency embedded module (FEM) is designed. ASC guides the network to focus on the positive sample pairs with different TAAs. FEM combines pulse cosine transform (PCT) with the network training process effectively to enrich frequency-domain information. In addition, a new dataset named SAR aircraft category dataset is constructed for the experiments. Compared with other few-shot SAR target classification approaches, our model efficiently integrates the scattering characteristics with the learning process, and the test accuracy for 5-way 1-shot has been improved by 4.74%. Finally, the experimental results are provided to demonstrate the validity of the proposed method.

Keywords: scattering characteristics; network; analysis network; sar images; characteristics analysis; sar

Journal Title: IEEE Transactions on Geoscience and Remote Sensing
Year Published: 2022

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