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Initial Analysis of Spectral Smile Calibration of Hyperspectral Imager Suite (HISUI) Using Atmospheric Absorption Bands

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This article reports on the initial analysis of spectral smile calibration of the Hyperspectral Imager Suite (HISUI) onboard the International Space Station, which has been continuously acquiring data since September… Click to show full abstract

This article reports on the initial analysis of spectral smile calibration of the Hyperspectral Imager Suite (HISUI) onboard the International Space Station, which has been continuously acquiring data since September 4, 2020. HISUI is an optical hyperspectral imager consisting of two subsystems: VNIR covering 400–980 nm at intervals of 10 nm and SWIR covering 895–2481 nm at 12.5-nm intervals. Based on the atmospheric correction for actual observation images, we assessed cross-track dependences of the wavelength deviation (spectral smile) and the full-width at half-maximum (FWHM) of the HISUI response function. We found that significant spectral smile was observed, with maximum variations of 1.8 nm in VNIR and 4.3–4.5 nm in SWIR. In addition, the cross-track variation of FWHM was observed with maximum variations of 5.0 nm for VNIR and 2.5–3.5 nm for SWIR. We used the results to model the smile functions to update a smile correction table in the internal calibration system of HISUI. Then, we evaluated how the smile functions reduce the spectral smile in the data acquired after the update on September 27, 2021. We confirmed that VNIR showed a nearly flat profile within 0.25 nm with a nearly constant FWHM. For SWIR, although a slight amount of spectral smile and a variation of FWHM were still observed partly due to wavelength dependence in the spectral smile, the spectral smile was reduced to less than ~2.2 nm. This study demonstrated that wavelength calibration using actual observation images for ground surfaces is important for the characterization of hyperspectral sensors.

Keywords: spectral smile; hisui; hyperspectral imager; calibration

Journal Title: IEEE Transactions on Geoscience and Remote Sensing
Year Published: 2022

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