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A Passive Non-Interference Scheme for Synchronously Measuring Multiple Parameters With Single Sensing Unit

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The acquisition of parameters plays a crucial role in rotary systems, while multiparameter measurements with single or integrated sensing units have distinct advantages over those with multiple or separated ones.… Click to show full abstract

The acquisition of parameters plays a crucial role in rotary systems, while multiparameter measurements with single or integrated sensing units have distinct advantages over those with multiple or separated ones. This work proposed a passive non-interference scheme for synchronously measuring multiple parameters, such as rotation speed, diametral deviation, and diametral vibration, by fully using the vibrational characteristics of a magnet-integrated piezo-cantilever excited by rotational magnetic coupling. First, the measurement of rotation speed is achieved with high linearity, high accuracy, and broad range. Second, the measurement of diametral deviation features non-contact compared to mechanical or electromagnetic ones, and is light-free compared to optical methods. Third, the measurement of diametral vibration is discretely realized by creatively considering physical magnetic coupling as an equivalent to digital signal sampling, which is fundamentally different from previous ones, and extendable to other physical couplings. The proposed scheme experimentally demonstrated its effectiveness and feasibility with a typical rotary disk and is theoretically analyzed by the interaction between rotating magnets, the electro-mechanical response of the piezo-cantilever, as well as the coupling-based sampling model. The proposed scheme is believed to have a widespread application, from the precision measuring of rotary systems to health monitoring of manufacturing centers, further fulfilling its potentials like structure miniaturization and higher adaptivity.

Keywords: synchronously measuring; passive non; non interference; scheme synchronously; interference scheme; scheme

Journal Title: IEEE Transactions on Instrumentation and Measurement
Year Published: 2022

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