During the raster scanning of atomic force microscopes (AFMs), the coupling effect from the fast-axis to the slow-axis is extraordinarily pernicious, especially when the scanning rate is set high. Whilst… Click to show full abstract
During the raster scanning of atomic force microscopes (AFMs), the coupling effect from the fast-axis to the slow-axis is extraordinarily pernicious, especially when the scanning rate is set high. Whilst great efforts have been made in the field of piezo-actuated stages, less attention is paid on control design to mitigate this coupling effect. In this paper, we propose a modified repetitive control based cross-coupling compensation (MRC-CCC) approach for high-speed and high-precision scanning motion control of a piezoelectric tube scanner in AFMs. Based on the experimental observations, we first describe this coupling effect as the periodic disturbance to the output of the slow-axis when the fast-axis is designed to track triangular trajectories. Then, the MRC-CCC controller is developed to remedy the periodic disturbances, which generates the compensation signals targeting the coupling effect. Therefore, the complicated modeling of the cross-coupling effect is avoided, which significantly reduces the complexity of usage. To ensure the high-precision tracking performance for the slow-axis in scanning, we further design a tracking controller that combines with the offline trained MRC-CCC controller. Finally, comparative experiments are conducted on an AFM piezoelectric tube scanner. Experimental results show that the developed MRC-CCC approach significantly compensates for the coupling effect, in which the root-mean-square tracking error is substantially reduced from 172.1 to $3.3\text{ nm}$ at the scanning rate of 40 Hz. We also perform high-speed scanning tests for AFM imaging to verify the effectiveness of the development.
               
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