LAUSR

This paper presents a new simple model for representing and characterizing the loss effect introduced by the roughness of the metal-to-dielectric interface on the conductor attenuation of substrate integrated waveguides. The proposal allows for the parameter determination using simple linear regressions which can be implemented directly from S-parameter data and avoids the use of data corresponding to structures with perfectly smooth conductors. In fact, no previous knowledge of the metal surface profile is required to obtain the model parameters. Excellent agreement between full-wave simulations and experimental data at several tens of gigahertz is achieved.