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This paper presents a compact model of latchup considering design and process dependence. The new approach is more realistic and inspirited from the classical model. This model was used to… Click to show full abstract
This paper presents a compact model of latchup considering design and process dependence. The new approach is more realistic and inspirited from the classical model. This model was used to confirm the single-event latchup (SEL) robustness of D-flip-flops (DFFs) used in Readout Circuit of Infrared-sensors developed by Sofradir. SEL cross sections are presented by the mean of the Monte Carlo tool MUSCA SEP3 in order to validate the new latchup modeling approach.
Keywords:
single event;
event latchup;
compact modeling;
latchup;
circuit
Journal Title: IEEE Transactions on Nuclear Science
Year Published: 2019
Link to full text (if available)
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Journal Title: IEEE Transactions on Nuclear Science
Year Published: 2019
Link to full text (if available)
Share on Social Media: Sign Up to like & get
recommendations!