A study of the reset transient of charge-sensitive amplifiers operating with a pulsed switch in parallel to the feedback capacitance is presented. Analytical models have been developed for amplifiers in… Click to show full abstract
A study of the reset transient of charge-sensitive amplifiers operating with a pulsed switch in parallel to the feedback capacitance is presented. Analytical models have been developed for amplifiers in both linear and slew rate regimes during the reset phase. The models predict the time interval required to reset the amplifier that, in most cases, significantly differs by the simple discharge of the feedback capacitance through the switch resistance and strongly depends on the open-loop gain and bandwidth of the core amplifier and on the input capacitance. The models also quantitatively predict spurious voltage transients at the preamplifier’s input and possible ringings at the output, as a function of the main general parameters of the circuit. A case application study of the presented model is proposed for low-capacitance detectors, such as semiconductor drift detectors or small pixel detectors.
               
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