This letter proposes a safe operating area (SOA) concept for film capacitors in dc-link applications. The SOA is presented by capacitor voltage and ripple current, considering the impact of ambient… Click to show full abstract
This letter proposes a safe operating area (SOA) concept for film capacitors in dc-link applications. The SOA is presented by capacitor voltage and ripple current, considering the impact of ambient temperature, degradation, and parameter variance. The theoretical derivations and proof-of-concept experimental verifications are given.
               
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