The high energy density (HED) capacitor is the energy storage component in capacitive pulsed power systems. There is an obvious voltage decay phenomenon, when the capacitor is disconnected from the… Click to show full abstract
The high energy density (HED) capacitor is the energy storage component in capacitive pulsed power systems. There is an obvious voltage decay phenomenon, when the capacitor is disconnected from the power supply, and the higher the energy density is, the faster the voltage decays. And the voltage maintaining performance (VMP) of capacitor is of special interests especially in the occasion, which has high requirement of the output energy efficiency. For the HED capacitor made of metallized films, there are three factors affecting the VMP: self-healing, dielectric leakage, and polarization. In order to investigate the effect of above factors on the VMP of HED capacitor, the experiments and analysis of self-healing characteristics, dielectric leakage in stable status, and slow polarization are carried out. For a 4 kV/0.8 MJ/m3 HED capacitor, the self-healing is responsible for 12.68% of the whole voltage decay, and the dielectric leakage contributes for 7.89% with the fact that the insulation resistance is in the range of
               
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